University of Twente Student Theses
The Effect of Thermal Annealing on Stress-Induced Leakage Current in Gate Oxides
Keizer, A.A. (2021) The Effect of Thermal Annealing on Stress-Induced Leakage Current in Gate Oxides.
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Full Text Status: | Access to this publication is restricted |
Embargo date: | 2 July 2024 |
Item Type: | Essay (Bachelor) |
Faculty: | EEMCS: Electrical Engineering, Mathematics and Computer Science |
Subject: | 51 materials science, 53 electrotechnology |
Programme: | Electrical Engineering BSc (56953) |
Link to this item: | https://purl.utwente.nl/essays/87352 |
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